ICT Test Probes are used in highest numbers among PCB testing needs, because at in-circuit test highest possible test coverage is the target to be reached. In order to measure as many as possible analog and digital components, these probes main function is to transfer measured electrical signals of each component on PCBs. In order to reach this, they need to contact dedicated test points, which are designed to maximise testability (DFT – Design for Test) of printed circuit boards.
Main international ICT Test Probe sizes are 100 Mil, 75 Mil, 50 Mil, 39 Mil, these standard sizes can be used because PCB design engineers during the design phase of PCB’s follow the rules of DFT – Design for Testability.
ICT Testers are equipped with different types of interface probes. Some are called Mint Pins, some have different names, depending on tester manufacturers. We offer high quality interface probes for all main ICT test systems worldwide.
Lead-Free Test Probes are manufactured with high-preload spring technology, which provides much better contact them standard ICT probes! Especially on OSP contacting applications. Try and experiense the growth of Frist Yield output in your ICT fixtures with our LF probe series. Combining this advantage with Lead-Free Tip Styles further improves your productivity when using our LF Probe series.
ICT Testers are equipped with different types of interface probes. Some are called Mint Pins, some have different names. We offer high quality interface probes for all main ICT test system manufacturers worldwide.
Next to this our special solution for OSP contacting problems are fulfilled with our famous Lead-Free - LF – series ICT probes. This serie provides extremely high preload compared to standard ICT test probes immediately at the beginning of working stroke. This feature combined with Lead Free types tip styles offer great results and extended maintenance cycles on ICT Test Fixtures
Lead-Free Series – high preload with Lead-Free Tip styles for OSP contacting problems
ST Series - for all general In-circuit test requirements
International Standard series – also commonly used in ICT fixtures
Various receptacles – wireless, wire wrappeable, solderable, crimpable, prewired
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